Computational Electronics Group at Boston University

Semiconductor Materials and Devices Simulation and Design

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Dr. Matsubara will give an invited talk at SPIE In San Diego.

Dr. Matsubara will the invite talk entitled: First-principles calculations of strain effect and vacancies/impurities related to the Shockley-Read-Hall process in MWIR and LWIR HgCdTe alloys

Abstract - Mercury cadmium telluride (HgCdTe) has long been the material of choice for infrared (IR) detectors. It covers a very wide IR spectral range, including the mid-wavelength IR (MWIR: 3-5 μm) and long-wavelength IR (LWIR: 8-14 μm) regions. The performance of these detectors is degraded by residual strain introduced during the growth process. We will discuss the effects of strain on the band gap energies and band structures of MWIR and LWIR HgCdTe alloys. In addition, the carrier generation-recombination process significantly impacts the performance of the devices. In particular, Shockley-Read-Hall (SRH) recombination plays a crucial role in determining carrier lifetimes in low carrier concentration HgCdTe. We will explore plausible defect/impurity states within the band gap of MWIR and LWIR HgCdTe alloys responsible for the SRH process. Moreover, we will evaluate their non-radiative carrier capture process through first-principles calculations.

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